I/O module simplifies analog testing

JTAG TECHNOLOGIES JT 2149/DAF I/O compact, mixed-signal (Digital/Analog/Frequency) measurement module provides both digital and analog test access to PCBs via firm’s QuadPod signal conditioning interface. When connected to a circuit board via edge connector or test fixture/jig test pins the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made. Product includes 16 dual-purpose digital pins capable of digital I/O stimulus and response at voltages of 1.0 to 3.6V plus frequency measurements of up to 128MHz on any pin.

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