Integrated optical microscope is automated, laserless
EP&T MagazineElectronics Production / Materials Test & Measurement AFM automated ICSPI laserless microscope optical Redux system test
ICSPI Redux AFM automated and laserless optical microscope system operates with an integrated piezoresistive sensor that allows for laser alignment-free operation and a fully automatic approach. This permits the user to collect nanoscale data effortlessly. All of the sensors and scanners of traditional AFM instruments have been integrated onto a single 1mm x 1mm chip. System provides automatic sweep, approach and scanning, along with motorized XY and Z stages. Unit is also equipped with an environmental cover, as well as an AFM tip cartridge with TipGuard. Tool saves users monthly costs in AFM usage fees at third-party labs.