OPHIR PHOTONICS NanoScan v2 scanning slit beam profiler is a NIST-calibrated system that uses moving slits to measure beam sizes from microns to centimeters at beam powers from microwatts to kilowatts, with little to no attenuation. Product provides an enhanced graphical user interface (GUI) with support for the Microsoft Windows ribbon toolbar. Dockable and floatable windows plus concealable ribbon toolbars allow users to make the most of any size display, from small laptops to large, multi-monitor desktops.
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