Electronic Products & Technology


Tin Whiskers Seminar: Indium

Print this page

October 19, 2021

Tin whiskers are thinner than a human hair, but these electrically-conductive structures have been known to cause sudden failures and intermittent problems due to their ability to short closely spaced electronic circuits.

On Tuesday, Oct. 19, Indium Corporation’s Ron Lasky, Ph.D., PE, senior technologist, will host a webinar on these crystalline structures of tin at 1 p.m. EDT

He will also provide a description of Failure Modes and Effects Analysis (FMEA) as a technique to assess tin whisker risk for a given technology, which will then be discussed. He will conclude this workshop with a discussion of tin whisker reliability strategies for consumer and mission critical products. At the end of the presentation, attendees will have all of the basic relevant information to develop an effective tin whisker strategy.

Visit event's website

Print this page