
OSA adds high-power laser diode measurement functionality
EP&T Magazine
Electronics Test & Measurement analyzer chips diode LASER LD optical OSA pulsed spectrumANRITSU MS9740B optical spectrum analyzer (OSA) meets the need for accurate, repeatable, and efficient testing of pulsed laser diode (LD) chips. The solution reduces test time and produces repeatable measurements when evaluating LD chips during production, helping speed time-to-market. Solution accelerates optical spectrum evaluation by eliminating the need for a trigger signal, which is necessary with alternative solutions. Measurement reproducibility of +/-1.4dB for Side Mode Suppression Ratio (SMSR) is assured when the expanded measurement functionality is added to the MS9740B. A low SMSR variation improves LD chip yield and production efficiency. Product is designed for production environments. It features high dynamic range of up to 70dB (±1nm from peak wavelength), high resolution, and fast sweep speeds of <0.2 sec over a wavelength range of 600nm to 1750nm.