Electronic Products & Technology

Jitter analysis on clock, data signals simplified on oscilloscopes

EP&T Magazine   

Electronics

 ROHDE & SCHWARZ RTO-K12 jitter analysis option provides a wide range of intelligent functions. For example: A wizard-driven menu assists users with the most important measurements in order to obtain quick results. Configurable software clock data recovery (CDR) was implemented for the automatic time interval error (TIE) measurement function. The track function shows the progression of measured values and the time correlation with the trace, opening up additional analysis options. Geometric box elements help users quickly create mask tests.

http://www.rohde-schwarz.com

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