Dual-sided flying probe tester boosts board handling capability
TAKAYA APT-1600FD-SL Dual Sided Flying Probe test system for assembled PCBAs delivers both high speed and a larger testing area designed to accommodate large PCBAs for the emerging markets of 5G communications and BMS (Battery Management System) applications. SL series provides a 48% larger test area, which aligns perfectly with applications including semiconductor test probe card manufacturers. Unit deploys the flying probes to both sides of a UUT. This dual-sided probing contact contributes to a marked increase in test coverage and also ensures the shortest amount of test time.