Electronic Products & Technology

Automated characterization software suite adds wafer-level testing

April 23, 2013  EP&T Magazine

KEITHLEY INSTRUMENTS ACS V5.0 update to Automated Characterization Suite (ACS) software is optimized for automated wafer-level parameter test applications, including automated characterization, reliability analysis, and known good die testing. Product specifically leverages the high power capabilities of firm’s Model 2651A (high current) and Model 2657A (high voltage) System SourceMeter SMU instruments to enable automated wafer-level testing of high power semiconductor devices like power MOSFETs, IGBTs, BJTs and diodes.


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