SMU modules solve tough test challenges
TEKTRONIX Keithley 4200A-SCS Parameter Analyzer source measure unit (SMU) modules can perform low-current measurements even in the presence of high load capacitance due to long cables and complex test setups. Among the notable test applications facing this challenge are LCD display manufacturing and nano FET device testing on a chuck.
4201-SMU and 4211-SMU are designed specifically for test setups with long cables, switch matrices, gate contacts to the chuck, and other fixturing. Such test setups, which are required in a number of low current measurement applications, can increase the capacitance seen at the output of the SMU, even though the device under test itself has very low capacitance. When the test connection capacitance is too high, the resulting low current measurements can become unstable.
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