Single-instrument solution reduces test cost, speeds test time

ANRITSU BERTWave MP2100B single test solution supports simultaneous BER measurements and eye pattern analyses for more efficient and accurate evaluations of high-speed optical modules and devices used in data-center servers and network devices. By combining the measurement capability of two separate instruments, unit reduces cost-of-test by as much as 40% and significantly improves test times and measurement reliability to speed product time to market. A built-in 12.5 Gbit/s Pulse Pattern Generator (PPG) and Error Detector (ED) support up to 4 channels. The PPG outputs high-quality signals with low jitter of 1 ps and Tr/Tf of only 24 ps, while the ED has a high sensitivity of 10 mVp-p. http://www.anritsu.com