Electronic Products & Technology

Rugged assembly reduces cost of high throughput RF test

EP&T Magazine   


W.L. GORE Rugged 18GHz cable assembly joins firm’s PHASEFLEX Microwave/RF Test Assemblies line, suited for high throughput production test applications in the wireless infrastructure market. Device’s increased durability reduces total costs for testing, as it lasts longer and decreases the frequency of cable assembly replacements. Product’s stable performance ensures precise measurements and repeatability, which reduces testing errors.



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