Electronic Products & Technology

Parallel parametric test system delivers high throughput

Stephen Law   

Electronics Test & Measurement test

KEYSIGHT TECHNOLOGIES P9002A parallel parametric test system provides high throughput and cost effective wafer test to accelerate time-to-market in R&D and lower cost-of-test in manufacturing. Device is designed to target commercial applications like 5G, data center, artificial intelligence (AI) and automotive are increasing test parameters. Product addresses challenges and enables manufacturers to quickly ramp capacity. Test system serves as a flexible option structure for up to 100 channels parallel test resources, including test capabilities required for parametric tests at each test resource. System has the ability to add options based on test requirements, with license structure for cost effective budgeting. Product delivers unique parametric test technologies and fast capacitance measurement generates improved throughput over the 4080 series parametric testers.

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