Integrated test system speeds characterization of passive components

EXFO CTP10 Component Test Platform and suite of modules provides accurate testing of a wide variety of passive components in R&D or manufacturing. Test system improves insertion loss (IL) and return loss (RL) measurement for a wide variety of passive components, including photonics integrated circuits. Unit can be used to extensively characterize components or in automated mode for high volume production. System delivers a capability to measure IL and RL in a single sweep up to 1000 nm/s.