Electronic Products & Technology

Product

HALT/HASS thermal test system detects thermal defects


PDR IR-TS Series of micro-focused HALT/HASS thermal test system includes a One Bench Top System and TS-2100 Cabinet System that thermally cycles key critical components and assemblies to detect defects. Using a non-destructive duel thermal stress screening process, based on a variation of HALT/HASS principles, product is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects. http://www.pdr-rework.com


Print this page

Related