Electronic Products & Technology

HALT/HASS thermal test system detects thermal defects

May 5, 2017  Stephen Law

PDR IR-TS Series of micro-focused HALT/HASS thermal test system includes a One Bench Top System and TS-2100 Cabinet System that thermally cycles key critical components and assemblies to detect defects. Using a non-destructive duel thermal stress screening process, based on a variation of HALT/HASS principles, product is able to focus the testing on suspected problem areas to safely screen out early field failures caused by design, environmental, production and structural defects. http://www.pdr-rework.com

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