Atomic force microscopes are easy-to-use
Stephen LawElectronics Production / Materials inspection Microscopes production R&D test
AFM100 Plus Atomic Force Microscopes (AFM) systems deliver ease of use and enhanced reliability for high-throughput R&D or quality control applications. The Scanning Probe Microscope (SPM) scans the surface of a sample using a sharp tip typically with a radius of a few nanometers (1 nanometer = 1/1,000,000 millimeter). Unit can provide both high-resolution visualization of surface morphology and simultaneous mapping of various other physical properties at the nanoscale. Unit can be utilized in a wide variety of applications, including high-resolution imaging of nanomaterials such as graphene and carbon nanofibers, 3D shape observation over wide areas exceeding 0.1 mm, roughness analysis, and physical property evaluations.
HITACHI HIGH TECH