Electronic Products & Technology

2-slot test backplane suits VPX board developers, integrators

EP&T Magazine   


ELMA BUSTRONIC 2-slot test backplane with VITA 46 specifications allows user to power up and test J1 fabric connections as they would be interconnected in the target application. Signals can be passed from one slot to the next via high speed interconnecting cables, via signals introduced through the J1 fabric connector, or accessed on the J1 fabric connector using the test backplanes SMA and SATA cable headers. The test backplane accepts 6U cards with the 3U size supported by use of a shelf divider. For convenience in attaching probes, the slot pitch is an extra wide 1.6.



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