INTEPRO SemTest automated test system for reliability and extended lifetime testing of power semiconductors including IGBT, MOSFET, SCR, Diode and Bipolar parts and modules. The fully integrated solution meets the requirements of JEDEC standards and may be used for product development characterisation. Product is comprised of a test system, thermal oven and test software with optional chiller and cold plates. System performs a combination of thermal and electrical cycles to verify new products, processes and materials including (SiC) Silicon Carbide based semiconductors or devices designed to meet RoHS requirements. SemTest is designed to accelerate any failure mechanisms in the device in order to determine its life and functional operating limits.
