March 02, 2023

Short-wave Infrared: The Dawn of a New Imaging Age?

Time: 12:00 PM – 1:00 PM EST

Yole Group will deliver the free webinar “Short-wave Infrared: The Dawn of a New Imaging Age?” in partnership with the Edge AI and Vision Alliance.

“Short wave” refers to a portion of the infrared spectrum between 1 µm and 3 µm in wavelength. Short-wave infrared (SWIR) imagers based on InGaAs technology have found use in defense markets, for example, where they implement laser target designation and enhanced vision in harsh conditions, as well as in industrial applications such as semiconductor defect detection, package content inspection and inventory sorting.

Historically, SWIR imaging has been a niche market, with cost a key factor limiting broader adoption. InGaAs image sensors typically range in cost from a few thousand to more than ten thousand dollars. However, SWIR is now at a turning point, driven by the emergence of more cost-effective implementations based on quantum dots, germanium and various organic and other materials. The promise of lower-price image sensors has attracted interest in SWIR from consumer electronics and other high-volume applications. For this market growth potential to become a reality, however, the technology will also require further refinement in sensitivity, dark current, response time and other metrics.

This webinar is presented by Axel Clouet, Ph.D., a technology and market analyst for imaging and displays within the photonics and sensing division at Yole Intelligence, part of the Yole Group.

Clouet will discuss the history, current status and future technology and market trends for SWIR imaging, including comparisons with alternative imaging approaches, as well as the evolving and maturing ecosystem that supports SWIR imaging. A question-and-answer session will follow the presentation. Prior to joining Yole Group (previously known as Yole Développement), Clouet obtained an MSc from the Grenoble Institute of Technology and a Ph.D. from the University of Grenoble in collaboration with CEA-LETI, where he worked on color and noise aspects of CMOS image sensors. He is the author and co-author of multiple scientific papers and conference presentations.