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GaN Systems WebinarThe Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switchin

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May 16, 2019


The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications.

Begins at 11am Eastern Daylight Time

  • GaN Systems is holding a webinar on Thursday, May 16th at 11:00 AM EDT titled, The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications
  • Topics discussed include GaN reliability testing methods and quantitative analysis of RDS(on)
  • Presenter is Dr.  Ruoyu (Roy) Hou, Power Electronics Application Engineer at GaN Systems

 

 

Source: GaN Systems
Distributed by Reportable, Inc.


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