Event
GaN Systems WebinarThe Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switchin
May 16, 2019
The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications.
Begins at 11am Eastern Daylight Time
- GaN Systems is holding a webinar on Thursday, May 16th at 11:00 AM EDT titled, The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications
- Topics discussed include GaN reliability testing methods and quantitative analysis of RDS(on)
- Presenter is Dr. Ruoyu (Roy) Hou, Power Electronics Application Engineer at GaN Systems
| Source: GaN Systems Distributed by Reportable, Inc. |
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