Electronic Products & Technology
Event

GaN Systems WebinarThe Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switchin

May 16, 2019

The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications.

Begins at 11am Eastern Daylight Time

  • GaN Systems is holding a webinar on Thursday, May 16th at 11:00 AM EDT titled, The Effect of Dynamic On-State Resistance to System Losses in GaN-based Hard-Switching Applications
  • Topics discussed include GaN reliability testing methods and quantitative analysis of RDS(on)
  • Presenter is Dr.  Ruoyu (Roy) Hou, Power Electronics Application Engineer at GaN Systems

 

 

Source: GaN Systems
Distributed by Reportable, Inc.


Visit event's website
https://event.on24.com/eventRegistration/EventLobbyServlet?target=lobby20.jsp&eventid=1986043&sessionid=1&key=BADA5B5909D3F4EAE9BE323025646C16&eventuserid=240009488