March 21 - March 24, 2021

The 2021 IEEE International Reliability Physics Symposium to Showcase Latest Original Research in Reliability for Semiconductor Devices, Integrated Circuits, and Microelectronic Systems in a Virtual Conference

The upcoming 2021 IEEE International Reliability Physics Symposium (IRPS), the industry’s premier technical conference for engineers and scientists to present the latest original research in microelectronics reliability, will be held virtually from March 21 – 24, 2021. The Symposium will feature a number of special focus sessions highlighting novel and emerging areas of electronic reliability, as well as topics relating to conventional semiconductor, integrated circuit, and microelectronic assembly reliability.

• Embedded technologies & design architectures for neuromorphic computing reliability
• Emerging memory technology reliability – STT-MRAM, SOT-MRAM, ferroelectric memory devices
• New developments in reliability for RF/mmW/5G devices – CMOS, SiGe, BiCMOS, SOI, & GaAs
• Four keynote speakers from SK Hynix, Cree/Wolfspeed, GlobalFoundries, & Silicon Labs
• A series of 22 90-minute tutorial sessions, designed to provide a comprehensive overview of reliability topics
• Interactive evening workshops covering eleven different reliability focus areas
• More than 50 posters will be presented virtually during the poster session
• A virtual supplier exhibition will be held in conjunction with the technical program
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