Root Causes of Conducted and Radiated Emission Failures including Do’s & Don’ts of PCB Layout Design
Presented by: QAI
Time: 10:00AM, Founders Room
This seminar is put together for technical and certification professionals responsible for design and certification of electronic products for the global market. It is critical to implement early in the design cycle the emissions and immunity safeguards to meet the rigorous certification guidelines. Many electronic products still lack some of the basic design guidelines causing non-compliance and product delay.
The aim of this presentation is to provide engineers and system designers with a set of practical diagnostic approaches, root causes of radiated emission failures, troubleshooting techniques and cost-effective solutions for the most common types of EMC problems. This one hour-long presentation will review: the use of preliminary scans, what to do when radiated emission failures are encountered, in-house measurement techniques, low-cost measurement tools and PCB layout techniques that will and won’t work for solving EMC problems.Register for this seminar
Using Pre-Approved Radio Modules
Presented by: Nemko Canada
Time: 11:30AM, Founders Room
The world is going wireless.
From IoT to personal communications to medical devices and beyond, wireless is being used more and more as the communications vehicle of choice.
Are you using or considering using pre-approved radio modules?
Learn how in this seminar.Register for this seminar
Faster time to market for your Power Conversion and IoT designs
Presented by: Xpresstest, Inc. and Tektronix
Time: 1:00PM, Founders Room
Market trends like SiC and GaN introduce new complexities into your power conversion circuits with faster switching speeds to get reduction in passive component sizes, requiring the need to be precise in circuit timing. You need to deal with higher sensitivity for gate threshold voltage and timing and also need a more robust PCB design for EMI/EMC issues due to higher switching frequencies.
As well, measuring low IoT currents can be very challenging. To maximize battery life, your product current draw must be kept to an absolute minimum. This requires that you use low power components and efficient techniques to de-energize components when they are not in use.
Learn more about these testing challenges and how to solve them during our free 1-hour seminar at Eptech Ottawa.
- Overcome high common mode voltages
- Simultaneously measure multiple control and timing signals
- Achieve faster automated power measurements
- Don’t fail compliance
- Determine the load current profile
- Industry Best practices and pitfalls to watch out for
Accelerated Test Methods
Presented by: NTS
Time: 2:30PM, Founders Room
When time runs thin toward the end of a product development program, testing engineers know that they have our work cut out for them. In the process of product development, testing is usually the last thing to be done before product launch. When processes are delayed or problems occur (which they often do) testing suffers because the time allotted for testing has been eaten up fixing some other problem. This is when Highly Accelerated Life Testing and Highly Accelerated Stress Screening, HALT and HASS respectively, are used. We will discuss:
- What is HALT/HASS testing?
- What are the benefits to using the test methodology?
- How and when do you apply it?
- Example test runs of a HALT test program
Register now and meet with our seminar speaker, Clayton Forbes, Operations Manager at NTS Boxborough.
We hope to see you there.
Note: This presentation will be in EnglishRegister for this seminar