The IEEE Photonics Society has announced a Call for Papers for its 2014 Summer Topicals Meeting Series, one of the premier technical gatherings for photonics science, technology and research, providing an opportunity to interact with leading researchers in an intimate conference environment.
A unique aspect of the Summer Topical series is that they are proposed and organized by volunteers of the IEEE Photonics Society. The conference will be held 14 – 16 July at the Delta Montreal Hotel in downtown Montreal.
The 2014 Summer Topicals Meeting Series is seeking original research in the following five topic areas focused the theme of Functional Material Integration & Optical Systems:
• Functional Meta- and Two-Dimensional Materials (FMTM) – covering the latest advances in photonics metamaterials functional structures and device configurations; as well as two-dimensional materials such as graphene
• Nanowire Materials and Integrated Photonics (NWIP) – covering materials, devices and heterogenous integration of photonics with nanowire technology
• Midwave Infrared Integrated Photonics (MWIP) – covering integrated photonics technologies, optical physics and emerging applications in midwave-IR photonics
• Nonlinear Optical Signal Processing (NOSP) – covering both traditional and emerging materials, nanophotonic platforms, as well as advanced optical signal processing algorithms
• Space Division Multiplexing Technologies for High Capacity Transmission (SDMT) – covering technologies with the potential to increase the efficiency of fiber transport infrastructures
Papers will be accepted starting on 9 February, 2014, with a paper submission deadline of 10 March 2014. Authors will be notified by early April of the status of their paper. Accepted papers will be published on the IEEE Xplore digital library shortly after the conference, providing worldwide exposure for all authors.
The complete Call for Papers can be found at: http://www.sum-ieee.org/call-for-papers. For registration and other information about the 2014 IEEE Summer Topicals Meeting Series, visit: http://www.sum-ieee.org/ or contact: