Electronic Products & Technology

Sidense memory macros meet JEDEC testing qualifications at 28 nm process nodes

December 31, 2013  Staff

OTTAWA, ON – Sidense has announced that its SHF Non-Volatile Memory (NVM) macros have met stringent JEDEC accelerated testing requirements for TSMC’s 28HPM and 28HPL process nodes.


Print this page

Related Stories

Leave a Reply

Your email address will not be published. Required fields are marked *

*