This network analyzer’s broad range and versatility eliminates the need for additional low-frequency-dedicated instruments, the company says.
Applications for the Agilent E5061B, part of the ENA series of network analyzers, include general RF-network measurements, such as filters or amplifier tests, and LF (low frequency) measurements necessary for loop-gain evaluation of dc/dc converters. The unit’s frequency coverage is suitable for power distribution networks (PDN) measurements, which evaluate the quality of a dc power supply circuit. This type of evaluation is increasingly important, especially in high-speed digital communication equipment.
Features of the Agilent E5061B include:
â€¢ S-parameter test port, 5 Hz to 3 GHz, with a wide dynamic range of 120 dB at > 1MHz, 90 dB at < 100 Hz;
â€¢ gain-phase test port, 5 Hz to 30 MHz, switchable 1 Mohm/50 ohm input;
â€¢ dc bias source from 0 to Â±40 Vdc, which can be added to ac test signal (for both S-parameter and gain-phase test port) or can be used as a sweepable dc source; and,
â€¢ form factor with a 254 mm depth, requiring less desktop space.
“The new E5061B represents an extension of a recognized industry standard in RF network analysis capabilities from Agilent,” said Akira Nukiyama, vice president and general manager of Agilent’s Component Test Division, Kobe. “Delivering the excellent RF performance that is common to the ENA series, the E5061B also offers accurate LF measurement capability. It’s the ideal, general-purpose LF-to-RF network analyzer that meets a variety of network measurements.”
Agilent’s ENA Series addresses a broad array of component and circuit tests, including EMC-related applications and automotive, wireless communications, aerospace and defense, education and medical applications. The series includes the Agilent E5071C (9 kHz to 8.5 GHz /300 kHz to 20 GHz), the Agilent E5061A/62A (300 kHz to 1.5/3.0 GHz) and now the Agilent E5061B, expanding coverage to LF measurement requirements down to 5 Hz.