FPGA PROBE FOR MIXED-SIGNAL OSCILLOSCOPES

The Agilent N5397A FPGA dynamic probe yields significant productivity improvements for engineering teams debugging Xilinx FPGAs. This application reduces the overall time and cost involved in debug and validation of designs incorporating FPGA development. The Agilent N5397A FPGA dynamic probe interacts with an on-chip virtual probing technology, enabling MSOs to capture up to 32 internal FPGA signals for each debug pin correlated to external analog activity.
www.agilent.com