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LOW TOUCHDOWN TEST SOCKETS

Quatrix photolithographic package test technology is an alternative to traditional contactor methods using spring pins for test sockets.


As a single plane of contacts with no moving parts, Quatrix processed-based technology offers repeatable dimensional placement tolerance, in conjunction with electrical performances (low contact resistance/low inductance), to meet aggressive roadmaps for package tests. With lower touchdown force between the contacts and the package, Quatrix test sockets eliminate problems associated with the high combined forces encountered in high pin count applications for chips with high-density I/O.
Kulicke & Soffa Industries


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